System for diagnosing impedances having accurate current source and accurate voltage level-shift

ABSTRACT

The present invention relates to a system for measuring a capacitor (C). A current source ( 12 ) is connected in parallel to the capacitor (C) between a supply plane (Vc) and ground  (VGND)  for providing a current to the capacitor (C). A voltage level-shift is connected between the supply plane (Vc) and the ground  (VGND)  in parallel to the capacitor (C) and in parallel to the current source (I2). The voltage level-shift senses a voltage across the electronic component (C) and provides a level-shifted output voltage V out  in dependence thereupon. The voltage level-shift comprises a resistor (R I ) connected in series with a current source (II) and an output port interposed between the resistor (RI) and the current source (I,). The current sources (I,) and ( 12 ) have opposite temperature coefficients such that the current provided to the electronic component is substantially constant.

This invention relates to airbag safety systems and in particular to a circuit for diagnosing capacitors used for firing airbag detonators.

Airbags are commonplace in automotive vehicles to improve occupant safety in collisions. In fact, nowadays airbags are standard equipment in many, if not most, late model automotive vehicles. Airbags are typically located in strategic places, such as the steering wheel of a vehicle, and are intended to reduce occupant injury in the event of a crash. An airbag system must trigger reliably in the event of an accident. To that end, at least one storage capacitor is provided to store the energy required to fire the airbag detonators. In order to guarantee reliable operation of these safety systems the storage capacitors are diagnosed, for example, when the ignition key is turned prior to starting the vehicle or in predetermined intervals.

Systems for monitoring the operability of airbag systems are known in the art and are disclosed, for example, in U.S. Pat. No. 6,486,566 issued Nov. 26, 2002 to Schumacher et al. and in U.S. Pat. No. 6,448,784 issued Sep. 10, 2002 to Belau et al.

The voltage level-shift in current capacitor measuring circuits is implemented using a voltage divider comprising two resistors. A first problem in such circuits is that the voltage level-shift across one of the resistors is not constant but depends on the voltage across the capacitor. Another disadvantage is that the current flowing through the resistors is temperature dependent because of the temperature dependency of the resistors. One solution to this problem is to provide resistors having sufficiently large resistance to minimize the temperature dependency. However, in order to provide resistors having sufficiently large resistance a substantially larger die area is consumed by the resistors.

Based upon the foregoing, there is a need to provide a capacitor measuring circuit capable of producing an accurate temperature independent current and an accurate temperature independent voltage level-shift that uses a smaller die area.

It is, therefore, an object of the invention to provide a system for diagnosing impedances capable of producing an accurate temperature independent current and an accurate temperature independent voltage level-shift.

It is further an object of the invention to provide a system for diagnosing impedances capable of producing an accurate temperature independent current and an accurate temperature independent voltage level-shift that uses a small die area.

In accordance with the present invention there is provided a system for measuring impedance of an electronic component comprising: a temperature compensated current source I connected in parallel to the electronic component between a supply plane V_(C) and ground for providing a predetermined substantially constant current to the electronic component; and, a temperature compensated voltage level-shift connected between the supply plane V_(C) and the ground in parallel to the electronic component for sensing a voltage across the electronic component and for providing a level-shifted output voltage V_(out) in dependence thereupon.

In accordance with an aspect of the present invention there is provided a storage medium having data stored therein, the data for when executed resulting in an integrated circuit design of a system for measuring impedance of an electronic component comprising: a temperature compensated current source I connected in parallel to the electronic component between a supply plane V_(C) and ground for providing a predetermined substantially constant current to the electronic component; and, a temperature compensated voltage level-shift connected between the supply plane V_(C) and the ground in parallel to the electronic component for sensing a voltage across the electronic component and for providing a level-shifted output voltage V_(out) in dependence thereupon.

In accordance with the present invention there is further provided a method for measuring impedance of an electronic component comprising: providing a predetermined substantially constant current to the electronic component by connecting a temperature compensated current source I in parallel to the electronic component between a supply plane V_(C) and ground; sensing a voltage across the electronic component and for providing a level-shifted output voltage V_(out) in dependence thereupon by connecting a temperature compensated voltage level-shift between the supply plane V_(C) and the ground in parallel to the electronic component.

In accordance with the present invention there is further provided a system for measuring impedance of an electronic component comprising: a current source I₂ connected in parallel to the electronic component between a supply plane V_(C) and ground for providing a current to the electronic component; and, a voltage level-shift connected between the supply plane V_(C) and the ground in parallel to the electronic component and in parallel to the current source I₂, the voltage level-shift for sensing a voltage across the electronic component and for providing a level-shifted output voltage V_(out) in dependence thereupon, the voltage level-shift comprising: at least a resistor R₁ connected in series with a current source I₁ and an output port interposed between the at least a resistor R₁ and the current source I₁, the current sources I₁ and I₂ having opposite temperature coefficients such that the current provided to the electronic component is substantially constant.

In accordance with an aspect of the present invention there is provided a storage medium having data stored therein, the data for when executed resulting in an integrated circuit design of a system for measuring impedance of an electronic component comprising: a current source I₂ connected in parallel to the electronic component between a supply plane V_(C) and ground for providing a current to the electronic component; and, a voltage level-shift connected between the supply plane V_(C) and the ground in parallel to the electronic component and in parallel to the current source I₂, the voltage level-shift for sensing a voltage across the electronic component and for providing a level-shifted output voltage V_(out) in dependence thereupon, the voltage level-shift comprising: at least a resistor R₁ connected in series with a current source I₁ and an output port interposed between the at least a resistor R₁ and the current source I₁, the current sources I₁ and I₂ having opposite temperature coefficients such that the current provided to the electronic component is substantially constant.

In accordance with the present invention there is further provided a method for measuring impedance of an electronic component comprising: providing a current to the electronic component by connecting a current source I₂ in parallel to the electronic component between a supply plane V_(C) and ground; and, sensing a voltage across the electronic component and providing a level-shifted output voltage V_(out) in dependence thereupon by connecting a voltage level-shift between the supply plane V_(C) and the ground in parallel to the electronic component and in parallel to the current source I₂, the voltage level-shift comprising at least a resistor R₁ connected in series with a current source I₁ and an output port interposed between the at least a resistor R₁ and the current source I₁, the current sources I₁ and I₂ having opposite temperature coefficients such that the current provided to the electronic component is substantially constant.

Exemplary embodiments of the invention will now be described in conjunction with the following drawings, in which:

FIG. 1 a is a simplified circuit diagram schematically illustrating a capacitor test;

FIG. 1 b is a simplified diagram schematically illustrating capacitor voltage as a function of time;

FIG. 2 a is a simplified circuit diagram schematically illustrating a capacitor test with voltage level-shift in series with a current source;

FIG. 2 b is a simplified circuit diagram schematically illustrating a capacitor test with voltage level-shift in parallel with a current source;

FIG. 3 is a simplified circuit diagram schematically illustrating a prior art capacitor test with voltage level-shift;

FIG. 4 is a simplified circuit diagram schematically illustrating a capacitor test with constant voltage level-shift according to the present invention;

FIG. 5 is a simplified circuit diagram schematically illustrating a capacitor test with a current source in series with a constant voltage level-shift according to the present invention;

FIG. 6 is a simplified circuit diagram schematically illustrating a capacitor test with a current source in series with a constant voltage level-shift using a cascode transistor according to the present invention;

FIG. 7 a is a simplified circuit diagram schematically illustrating a capacitor test with a current source in parallel with a constant voltage level-shift according to the present invention;

FIG. 7 b is a simplified circuit diagram schematically illustrating an alternative capacitor test according to the invention to the one shown in FIG. 7 a;

FIG. 8 a is a simplified circuit diagram schematically illustrating a capacitor measurement system according to the present invention;

FIG. 8 b is a simplified circuit diagram schematically illustrating an alternative capacitor measurement system according to the present invention implementing the circuit shown in FIG. 7 b;

FIG. 9 is a simplified circuit diagram schematically illustrating another capacitor measurement system according to the present invention; and,

FIG. 10 is a simplified circuit diagram schematically illustrating yet another capacitor measurement system according to the present invention.

In the following description the various embodiments of the invention will be illustrated in combination with the measuring of a capacitor. As will become evident to those of skill in the art, all the circuits are extendable for measuring impedances of other electronic components as well.

Capacitors are used, for example, in airbag safety systems to store the energy required to fire the airbag detonators. In order to guarantee reliable operation of these safety systems the capacitors are diagnosed. The capacitance of a capacitor is measured using, for example, the circuit shown in FIG. 1 a. A current I is drawn from capacitor C resulting in a voltage decreasing with time, as shown in FIG. 1 b. By measuring the time interval for a fixed voltage drop Δt, or by measuring the voltage drop ΔV for a fixed time interval Δt, the capacitance is determined as:

$\begin{matrix} {C = \frac{I\; \Delta \; t}{\Delta \; V}} & (1) \end{matrix}$

Since the capacitance is voltage dependent, it needs to be measured at an operating voltage, which is approximately 20V in airbag systems. Therefore, a voltage level-shift is needed to reduce the voltage into the range of a supply voltage in order to be easily processed. The voltage level-shift V_(LS) is placed in series with the current source I, as shown in FIG. 2 a or in parallel, as shown in FIG. 2 b.

The conventional method of implementing the voltage level-shift into a capacitor measuring circuit is shown FIG. 3. Current source I discharges capacitor C. In order to create a well defined slope it is desired for the current source I to be temperature and process independent. A voltage level-shift is implemented using a voltage divider comprising resistors R₁ and R₂ for shifting the output voltage V_(out) inside a supply voltage range. A first problem is that the voltage level-shift across resistor R₁ is not constant, but depends on the voltage V_(C) across the capacitor C. Another more important problem is that the current flowing through the resistors is temperature dependent because of the temperature dependency of the resistors. Provision of sufficiently large resistors minimizes the temperature dependency, however, at the cost of a substantially larger die area being consumed by the resistors.

Referring to FIG. 4, a capacitor measuring circuit 100 with a constant voltage level-shift according to the invention is shown. Again, a current source I is used to discharge capacitor C. The voltage level-shift is implemented using resistor R₁ and current source I₁. With the current source I₁ being determined by a reference voltage V_(REF), which is, for example, generated using a bandgap reference circuit, and a reference resistor R_(REF), which matches with the resistor R₁, the current I₁ is given by:

$\begin{matrix} {I_{1} = \frac{V_{REF}}{R_{REF}}} & (2) \end{matrix}$

resulting in a temperature and process independent voltage level-shift across the resistor R₁. However, the current I₁ is affected by the temperature dependency of the resistor R₁ and is drawn from the capacitor C. Therefore, it is necessary that the current I₁ is sufficiently small and the resistance of the resistor R₁ needs to be sufficiently large, thus consuming a large die area.

By placing the current source I in series with the constant voltage level-shift, as shown in FIG. 5 depicting a second embodiment 200 of a capacitor measuring circuit according to the invention, an accurate voltage level-shift is combined with an accurate current source. The circuit depicted in the dashed box measures a difference current I₂ between current I and current I₁. The difference current I₂ is then drawn from the capacitor C resulting in a total current drawn from the capacitor being equal to the current I. The voltage level-shift is implemented using resistor R₁ and current source I₁. By deriving I₁ from a reference voltage V_(REF) and a reference resistor R_(REF) that matches resistor R₁ an accurate temperature independent and process independent voltage level-shift is created across resistor R₁. Therefore, the capacitor measuring circuit 200 provides an accurate temperature and process independent voltage level-shift combined with an accurate temperature and process independent current source.

The circuit depicted in the dashed box in FIG. 5 is implemented, for example, using a cascode M₁, as shown in FIG. 6 depicting a third embodiment 300 of a capacitor measuring circuit according to the invention. The cascode M₁, directs the part of the accurate current that is not used by current source I₁ around I₁ to the capacitor C. It is noted that some difficulties arise with the implementation of the floating current source I₁ and that some headroom is necessary to properly bias the two current sources I₁ and I connected in series, limiting the signal swing at output V_(out).

Referring to FIG. 7 a, a fourth embodiment 400 of a capacitor measuring circuit according to the invention is shown. Here, current sources I₁ and I₂ are connected in parallel and to ground. The voltage level-shift is again implemented using resistor R₁ and current source I₁, with the current source I₁ being again determined by a reference voltage V_(REF) and a reference resistor R_(REF). The current source I₂ compensates the temperature dependency of current source I₁. If, for example, the resistors R₁ and R_(REF) have a positive temperature coefficient then current source I₁ has a negative temperature coefficient and, therefore, current source I₂ is designed to have a positive temperature coefficient. Therefore, the capacitor measuring circuit 400 provides an accurate temperature and process independent voltage level-shift combined with an accurate temperature and process independent current source. Further, the grounding of current source I₁ reduces the required headroom allowing larger signal swing at output V_(out).

FIG. 8 a illustrates a complete system implementation 500 according to the invention of the capacitor measurement circuit 400 shown in FIG. 7 a. The voltage level-shift is implemented using resistor R₁ and a current source comprising a V-I converter that converts a reference voltage V_(REF1) into a current using resistor R_(REF). The V-I converter comprises amplifier A₁, transistor M₁, resistor R_(REF), and capacitor C₁. Alternatively, a cascode is used in place of the V-I converter with the gate-source voltage of the cascode being compensated for using a similar transistor in the reference voltage driving the gate of the cascode. However, this alternative is less accurate. A feedback loop around the amplifier A₁ and the transistor M₁ controls the voltage across the resistor R_(REF) such that the voltage is equal to the reference voltage V_(REF1) yielding a current determined by the resistor R_(REF) and the reference voltage V_(REF1). This current is then drawn from capacitor C—which is to be measured—via the transistor M₁ and the resistor R₁. Thus, an accurate level-shift voltage across resistor R₁ is obtained determined by the reference voltage V_(REF1) and the ratio of the resistors R₁ and R_(REF). The capacitor C₁ is needed for frequency compensation of the V-I converter. Current I₂ is created using a similar V-I converter comprising amplifier A₂, transistor M₂, resistor R₂, and capacitor C₂, such that the current I₂ is determined by reference voltage V_(REF1) and resistor R₂. The level-shifted voltage at the drain of transistor M₁ is monitored by comparators CO₁ and CO₂. When the level-shifted voltage crosses reference voltage V_(REF3) a counter is started and when the level-shifted voltage crosses reference voltage V_(REF4) the counter is stopped yielding a digital n-bit output proportional to the capacitor value of capacitor C and a time interval determined by a digital clock voltage V_(CK).

The currents need to be temperature compensated. When resistors with positive and negative temperature coefficients are available, temperature compensation is achieved by combining a resistor with a positive temperature coefficient and a resistor with a negative temperature coefficient for each resistor shown in FIG. 8 a. To obtain sufficient accuracy, resistor R₂ is trimmed such that an absolute value spread of the resistors is compensated. Alternatively, temperature compensation is implemented by using single resistors for resistor R₁ and reference resistor R_(REF) and using only a combination resistor for resistor R₂ such that the temperature variation of the current I₁ is compensated by the current I₂. The transistors M₁ and M₂ are, for example, implemented as high-voltage DMOS transistors because of the high voltage across capacitor C. Furthermore, the inputs of the comparators CO₁ and CO₂ are protected when the circuit is not used and the current source I₁ is switched off. The protection is implemented, for example, using a switch between the drain of transistor M₁ and the comparator inputs and a clamping device connected between the two negative inputs of the comparators CO₁ and CO₂ and ground.

Alternatively, the current source I₂, depicted in FIG. 7 a, is replaced by a current source I-I₁, as shown in FIG. 7 b. Again, a current I₁ is implemented using a voltage based on a bandgap voltage and a resistor similar to R₁ draws current from R₁ yielding an accurate voltage level shift across R₁. The second current source, however, is now created by simply subtracting I₁ from a constant temperature independent current I. The result is that the current drawn from the capacitor C is identical to the constant current I.

Referring to FIG. 8 b, the circuit depicted in FIG. 7 b has been incorporated into the system implementation shown in FIG. 8 a. The circuit is similar to the one depicted in FIG. 8 a. However, a copy of the current I is now created using M₁₁. The copy of I₁ is then subtracted from the constant current I using M₁₂ and M₁₃. Thus, the current flowing through M₂ is equal to I-I₁. Since both I-I₁ and I₁ are drawn from the capacitor C, the total current drawn from C is the constant current I. By trimming resistor R₂ and using a combination of resistors with positive and negative temperature coefficients the current I is accurate and temperature independent.

If only resistors with a positive temperature coefficient are available, the system implementation 600 according to the invention, as shown in FIG. 9, is used. The circuit is identical to the circuit shown in FIG. 8 a except for resistors R₃ and R₄. By ensuring that the temperature coefficient of R₄ is larger than the temperature coefficients of the other resistors, the voltage across resistor R2 increases with rising temperature compensating the increase of the resistance resulting in a temperature independent current. To compensate the temperature variation of current I₁, current source I₂ is over-compensated.

A different implementation of the current source I₂ is realized in the system implementation 700 according to the invention, shown in FIG. 10. Here, the current source I₂ is implemented using a PTAT current source comprising transistors Q₂, Q₃, M₂, and M₃, and resistor R₂. The bias current of the PTAT source is mirrored out by transistor Q₁. The PTAT current source generates a voltage proportional to the absolute temperature across the resistor R2. The temperature variation of this voltage compensates the temperature variation of the resistor R₂ yielding a current I₂ substantially insensitive to temperature. Further tuning is obtained by using a combination of resistors with two different positive temperature coefficients for resistor R₂, which also provides compensation of the temperature variation of current I₁.

Numerous other embodiments of the invention will be apparent to persons skilled in the art without departing from the spirit and scope of the invention as defined in the appended claims. 

1. A system for measuring impedance of an electronic component comprising: a temperature compensated current source (I) connected in parallel to the electronic component (C) between a supply plane (V_(C)) and ground (V_(GND)) for providing a predetermined substantially constant current to the electronic component (C); and, a temperature compensated voltage level-shift connected between the supply plane (V_(C)) and the ground (V_(GND)) in parallel to the electronic component for sensing a voltage across the electronic component (C) and for providing a level-shifted output voltage V_(out) in dependence thereupon.
 2. A system for measuring impedance of an electronic component as defined in claim 1 wherein the temperature compensated current source (I) and the temperature compensated voltage level-shift are connected in series.
 3. A system for measuring impedance of an electronic component as defined in claim 1, wherein the temperature compensated voltage level-shift comprises at least a resistor (R₁) connected in series with a current source (I₁) and an output port interposed between the at least a resistor (R₁) and the current source (I₁).
 4. A system for measuring impedance of an electronic component as defined in claim 1, comprising compensation circuitry connected in parallel to the temperature compensated voltage level-shift for providing a current being a difference between the currents provided by the current sources (I) and (I₁).
 5. A system for measuring impedance of an electronic component as defined in claim 1, wherein the compensation circuitry comprises a cascode.
 6. A system for measuring impedance of an electronic component as defined in claim 3, wherein the at least a resistor (R₁) comprises two resistors having opposite temperature coefficients.
 7. A system for measuring impedance of an electronic component as defined in claim 1, wherein the electronic component (C) comprises a capacitor.
 8. A system for measuring impedance of an electronic component as defined in claim 1, wherein the electronic component (C) comprises a storage capacitor of an airbag system.
 9. A storage medium having data stored therein, the data for when executed resulting in an integrated circuit design of a system for measuring impedance of an electronic component comprising: a temperature compensated current source (I) connected in parallel to the electronic component between a supply plane (V_(C)) and ground (V_(GND)) for providing a predetermined substantially constant current to the electronic component (C); and, a temperature compensated voltage level-shift connected between the supply plane (V_(C)) and the ground (V_(GND)) in parallel to the electronic component (C) for sensing a voltage across the electronic component (C) and for providing a level-shifted output voltage V_(out) in dependence thereupon.
 10. A method for measuring impedance of an electronic component comprising: providing a predetermined substantially constant current to the electronic component by connecting a temperature compensated current source (I) in parallel to the electronic component (C) between a supply plane (V_(C)) and ground (V_(GND)) sensing a voltage across the electronic component (C) and for providing a level-shifted output voltage V_(out) in dependence thereupon by connecting a temperature compensated voltage level-shift between the supply plane (V_(C)) and the ground (V_(GND)) in parallel to the electronic component (C).
 11. A system for measuring impedance of an electronic component comprising: a current source (I₂) connected in parallel to the electronic component (C) between a supply plane (V_(C)) and ground (V_(GND)) for providing a current to the electronic component (C); and, a voltage level-shift connected between the supply plane (V_(C)) and the ground (V_(GND)) in parallel to the electronic component (C) and in parallel to the current source (I₂), the voltage level-shift for sensing a voltage across the electronic component (C) and for providing a level-shifted output voltage V_(out) in dependence thereupon, the voltage level-shift comprising: at least a resistor (R₁) connected in series with a current source (I₁) and an output port interposed between the at least a resistor (R₁) and the current source (I₁), the current sources (I₁) and (I₂) having opposite temperature coefficients such that the current provided to the electronic component is substantially constant.
 12. A system for measuring impedance of an electronic component as defined in claim 11 wherein the voltage level-shift comprises a V-I converter for providing a current in dependence upon a resistance of a reference resistor (R_(REF1)) and a reference voltage V_(REF1)across the reference resistor (R_(REF1)).
 13. A system for measuring impedance of an electronic component as defined in claim 12 wherein the V-I converter comprises a transistor and an amplifier connected to the base of the transistor.
 14. A system for measuring impedance of an electronic component as defined in claim 11, wherein the current source (I₂) comprises a V-I converter.
 15. A system for measuring impedance of an electronic component as defined in claim 11, further comprising: a start comparator (CO₁) in communication with the output port, a start reference voltage source (V_(REF3)), and a counter, for comparing the output voltage V_(out) with the start reference voltage and providing a comparison result, and if the comparison result is indicative of a match providing a signal in dependence thereupon to the counter; and, a stop comparator (CO₂) in communication with the output port, a stop reference voltage source (V_(REF4)), and the counter, for comparing the output voltage V_(out) with the stop reference voltage and providing a comparison result, and if the comparison result is indicative of a match providing a signal in dependence thereupon to the counter.
 16. A system for measuring impedance of an electronic component as defined in claim 15 comprising a digital clock in communication with the counter for determining a time interval between start and stop of the counter.
 17. A system for measuring impedance of an electronic component as defined in claim 11, wherein the current source (I₂) comprises a PTAT current source.
 18. A system for measuring impedance of an electronic component as defined in claim 11, wherein the electronic component (C) comprises a capacitor.
 19. A system for measuring impedance of an electronic component as defined in claim 11, wherein the electronic component (C) comprises a storage capacitor of an airbag system.
 20. A storage medium having data stored therein, the data for when executed resulting in an integrated circuit design of a system for measuring impedance of an electronic component comprising: a current source (I₂) connected in parallel to the electronic component (C) between a supply plane (V_(C)) and ground (V_(GND)) for providing a current to the electronic component (C); and, a voltage level-shift connected between the supply plane (V_(C)) and the ground (V_(GND)) in parallel to the electronic component (C) and in parallel to the current source (I₂), the voltage level-shift for sensing a voltage across the electronic component and for providing a level-shifted output voltage V_(out) in dependence thereupon, the voltage level-shift comprising: at least a resistor (R₁) connected in series with a current source (I₁) and an output port interposed between the at least a resistor (R₁) and the current source (I₁), the current sources (I₁) and (I₂) having opposite temperature coefficients such that the current provided to the electronic component is substantially constant.
 21. A method for measuring impedance of an electronic component comprising: providing a current to the electronic component (C) by connecting a current source (I₂) in parallel to the electronic component between a supply plane (V_(C)) and ground (V_(GND)); and, sensing a voltage across the electronic component (C) and providing a level-shifted output voltage V_(out) in dependence thereupon by connecting a voltage level-shift between the supply plane (V_(C)) and the ground (V_(GND)) in parallel to the electronic component (C) and in parallel to the current source (I₂), the voltage level-shift comprising at least a resistor (R₁) connected in series with a current source (I₁) and an output port interposed between the at least a resistor (R₁) and the current source (I₁), the current sources (I₁) and (I₂) having opposite temperature coefficients such that the current provided to the electronic component is substantially constant. 